TRADEMARK NAME Kla
KLA
By: Kla Corporation
Computer Hardware; Computer Hardware And Software For Testing, Inspecting, Characterizing, And Predicting Physical And Electrical Properties Of Semiconductors, Integrated Circuits, Microelectronics, Wafers, And Lithographic Masks; Instruments For Testing, Inspecting, And Characterizing Physical Properties Of Semiconductors And Integrated Circuits; Computer Software For Use In Process Control And Yield Management For The Semiconductor, Integrated Circuit And Related Microelectronics Manufacturing Industries; Computer Software For Providing Analytic Data On The Performance Of Inspection And Metrology Tools; Computer Hardware And Software Used For Monitoring, Controlling, And Improving Semiconductor And Integrated Circuit Manufacturing Processes; Computer Hardware And Software Used For Event Prediction In The Manufacturing Of Semiconductors And Integrated Circuits; Reconditioned Computer Hardware Tools, Namely, Inspection, Metrology And Testing Hardware That Are Used In Field Of Semiconductors, Thin Film Heads And Related Industries That Use The Same Manufacturing Technology; Semiconductor And Wafer Defect Inspection Systems Comprised Of Computer Software, Final Test Data And Electrical Data Algorithms, And Inline Defect And Metrology Computer Hardware Equipment; Computer Software For Use In Detecting Defective Semiconductor Electronic Components.
Trademark Details
This Brand Name KLA is applied by Kla Corporation
This Trademark was applied on date 28 November 2018
This Application has been filed by their agent None
| Trademark | KLA |
| Application No | 4066333 |
| Filing Dte | 28-11-2018 |
| User Detail | Proposed to be used |
| Certificate Number | 0 |
| Valid Until | |
| Goods and Service | Computer Hardware; Computer Hardware And Software For Testing, Inspecting, Characterizing, And Predicting Physical And Electrical Properties Of Semiconductors, Integrated Circuits, Microelectronics, Wafers, And Lithographic Masks; Instruments For Testing, Inspecting, And Characterizing Physical Properties Of Semiconductors And Integrated Circuits; Computer Software For Use In Process Control And Yield Management For The Semiconductor, Integrated Circuit And Related Microelectronics Manufacturing Industries; Computer Software For Providing Analytic Data On The Performance Of Inspection And Metrology Tools; Computer Hardware And Software Used For Monitoring, Controlling, And Improving Semiconductor And Integrated Circuit Manufacturing Processes; Computer Hardware And Software Used For Event Prediction In The Manufacturing Of Semiconductors And Integrated Circuits; Reconditioned Computer Hardware Tools, Namely, Inspection, Metrology And Testing Hardware That Are Used In Field Of Semiconductors, Thin Film Heads And Related Industries That Use The Same Manufacturing Technology; Semiconductor And Wafer Defect Inspection Systems Comprised Of Computer Software, Final Test Data And Electrical Data Algorithms, And Inline Defect And Metrology Computer Hardware Equipment; Computer Software For Use In Detecting Defective Semiconductor Electronic Components. |
| Business Name | Kla Corporation |
| Business Type | Private Limited Company |
| Business Sector | Manufacturing |
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