TRADEMARK NAME Semiconductor measurement analysis & reliability test (s
Semiconductor Measurement Analysis & Reliability Test (S
Software Technology Parks Of India
Semiconductor Measurement Analysis & Reliability Test (S
By: Software Technology Parks Of India
Scientific And Technological Services And Research And Design Relating Thereto; Industrial Analysis And Research Services; Design And Development Of Computer Hardware And Software.
Suitable industries
Computers, Scientific and Legal
Trademark Details
This Brand Name Semiconductor Measurement Analysis & Reliability Test (S is applied by Software Technology Parks Of India
This Trademark was applied on date 13 November 2018
This Application has been filed by their agent MRS. MEENA BANSAL
| Trademark | Semiconductor Measurement Analysis & Reliability Test (S |
| Application No | 3996409 |
| Filing Dte | 13-11-2018 |
| User Detail | Proposed to be used |
| Certificate Number | 3104006 |
| Valid Until | 13-11-2028 |
| Goods and Service | Scientific And Technological Services And Research And Design Relating Thereto; Industrial Analysis And Research Services; Design And Development Of Computer Hardware And Software. |
| Business Name | Software Technology Parks Of India |
| Business Type | Indidual |
| Business Sector | Service |
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