Snapshot Ellipsometer
J.a Woollam Co, Inc
Snapshot Ellipsometer
By: J.a Woollam Co, Inc
Apparatus For Measuring Physical And Optical Properties Of Semiconductor Substrates, Disk Drives, Magnetic And Optical Data Storage Media Using Electromagnetic Radiation, And Computer Programs For Operating Said Apparatus And Data Analysis.
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Apparatus Measuring Physical Optical Properties Semiconductor SubstratesTrademark Details
This Brand Name Snapshot Ellipsometer is applied by J.a Woollam Co, Inc
This Trademark was applied on date 22 July 2022
This Application has been filed by their agent GOWRISHANKAR S
Trademark | Snapshot Ellipsometer |
Application No | 5540022 |
Filing Dte | 22-07-2022 |
User Detail | Proposed to be used |
Certificate Number | 3375879 |
Valid Until | 22-07-2032 |
Goods and Service | Apparatus For Measuring Physical And Optical Properties Of Semiconductor Substrates, Disk Drives, Magnetic And Optical Data Storage Media Using Electromagnetic Radiation, And Computer Programs For Operating Said Apparatus And Data Analysis. |
Business Name | J.a Woollam Co, Inc |
Business Type | Private Limited Company |
Business Sector | Manufacturing |
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